These sites provide methods and techniques used in SPM. Scanning probe microscopes image the surface by scanning the object usually with a sharp tip and piezoelectric feedback. Category includes but is not limited to Scanning Tunneling Microscopes (STM), Atomic Force Microscopes (AFM),Scanning Force Microscopes (SFM)and Scanning Near-Field Optical Microscopes (SNOM).
Ultra-high optical resolution with tip enhanced microscopy with a parabolic mirror. Includes Apace and MagicSERS, a program for view/convert Winspec SPE-spectra.
Conference on Non-Contact AFM
August 15-18, 2005 conference in Germany for research on force controlled imaging, spectroscopy and manipulation.
Imaging Surfaces on a Fine Scale
Description of techniques and applications.
Modern Research and Educational Topics in Microscopy
Online edition of this book edited by A Mendez-Vilas and J Diaz.
Scanning Tunneling Microscopy
Image gallery of metal surfaces, generated at the IBM Almaden Research Center in San Jose, CA.
Using scanning probe microscopy to explore and manipulate semiconductor surfaces. Department of Chemistry at McMaster University.
University of Leuven, Belgium - The SPM Group
Scanning Probe Microscopy: introduction, research work, personnel, recent publications (some .pdf), image gallery, equipment, collaborations and links.
Last update:December 11, 2014 at 11:15:10 UTC